A microwave interferometer to enhance sensitivity of microwave measurement systems

Abstract

A single source microwave interferometer is proposed to enhance the sensitivity of a microwave measurement system. Theory of operation is provided to gain understanding of the device's generated null and the concept of a virtual match. The design and steps leading to its realization are discussed and developed through a comprehensive analysis involving simulations and prototyping. The performance of the interferometer is demonstrated through multiple applications, involving low contrast and high impedance measurements. Due to the ability of the interferometer to easily integrate with multiple measurement systems, it has potential benefiting applications that require extreme sensitivity and ones relying on differential information.