A global test generation system for sequential circuits

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34670Du.pdf (4.98 MB)

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1998

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Bibliography: p. 136-142

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Du, B. (1998). A global test generation system for sequential circuits (Doctoral thesis, University of Calgary, Calgary, Canada). Retrieved from https://ucalgary.scholaris.ca. doi:10.11575/PRISM/24552

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http://hdl.handle.net/1880/25965

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